Freiberg Instruments – sophisticated metrology solutions:
1. electrical characterisation of semiconductors like measurement of minority carrier lifetime and resistivity on semiconductors as Si, SiC, GaN etc.
2. Omega-scan XRD crystal orientation with precision of 1/1000° and measurement time of 5 seconds
3. worldwide highest sensitivity for bench top ESR (electron spin resonance) spectrometer for research and industrial use
4. optical und thermal stimulated luminescence (OSL/TL) for material research, dating and dosimetry