Neaspec developed the neaSNOM microscope, an ultra-stable & easy-to-use optical near-field microscope using a ground-breaking and patented optical background-filtering technique (PH-detection).

neaSNOM combines the best of two worlds – the nanoscale resolution of atomic force microscopy (AFM) with the analytical power of visible, infrared and even THz imaging & spectroscopy. At a spatial resolution of only 10nm the method only requires standard AFM sample preparation. This opens a new era for modern nano-analytical applications such as chemical nano-identification (IR), nano-plasmonic field mapping (VIS & IR) or free charge carrier nano-mapping (THz).

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